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1 Ergebnisse
1
Exploration of Activation Fault Reliability in Quantized Sy..:
, In:
2024 25th International Symposium on Quality Electronic Design (ISQED)
,
Taheri, Mahdi
;
Cherezova, Natalia
;
Ansari, Mohammad Saeed
... - p. 1-8 , 2024
Link:
https://doi.org/10.1109/ISQED60706.2024.10528372
RT T1 <cTitle>2024 25th International Symposium on Quality Electronic Design (ISQED)</cTitle>: T1 <Title>Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10528372&Exemplar=1&LAN=DE A1 Taheri, Mahdi A1 Cherezova, Natalia A1 Ansari, Mohammad Saeed A1 Jenihhin, Maksim A1 Mahani, Ali A1 Daneshtalab, Masoud A1 Raik, Jaan YR 2024 SN 1948-3295 K1 Quantization (signal) K1 Artificial neural networks K1 Benchmark testing K1 Hardware K1 Systolic arrays K1 Space exploration K1 Reliability K1 deep neural networks K1 design space exploration K1 quantization K1 fault simulation K1 reliability assessment SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/ISQED60706.2024.10528372 DO https://doi.org/10.1109/ISQED60706.2024.10528372 SF ELIB - SuUB Bremen
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