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1 Ergebnisse
1
Dual Use Circuitry for Early Failure Warning and Test:
, In:
2024 25th International Symposium on Quality Electronic Design (ISQED)
,
Coyle, Alexander
;
Jiang, Hui
;
Dworak, Jennifer
.. - p. 1-8 , 2024
Link:
https://doi.org/10.1109/ISQED60706.2024.10528709
RT T1 <cTitle>2024 25th International Symposium on Quality Electronic Design (ISQED)</cTitle>: T1 <Title>Dual Use Circuitry for Early Failure Warning and Test</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10528709&Exemplar=1&LAN=DE A1 Coyle, Alexander A1 Jiang, Hui A1 Dworak, Jennifer A1 Manikas, Theodore A1 Nepal, Kundan YR 2024 SN 1948-3295 K1 Timing K1 Manufacturing K1 Flip-flops K1 Canary Flip-flops K1 Design for Test K1 Fault Coverage K1 Silent Data Corruption (SDC) SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/ISQED60706.2024.10528709 DO https://doi.org/10.1109/ISQED60706.2024.10528709 SF ELIB - SuUB Bremen
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