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Sensitivity Analysis of SOT-MTJs to Manufacturing Process V..:
, In:
2024 25th International Symposium on Quality Electronic Design (ISQED)
,
Hossain, Mousam
;
Chowdhury, Muhtasim Alam
;
DeMara, Ronald F.
. - p. 1-5 , 2024
Link:
https://doi.org/10.1109/ISQED60706.2024.10528782
RT T1 <cTitle>2024 25th International Symposium on Quality Electronic Design (ISQED)</cTitle>: T1 <Title>Sensitivity Analysis of SOT-MTJs to Manufacturing Process Variation: A Hardware Security Perspective</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10528782&Exemplar=1&LAN=DE A1 Hossain, Mousam A1 Chowdhury, Muhtasim Alam A1 DeMara, Ronald F. A1 Salehi, Soheil YR 2024 SN 1948-3295 K1 Fabrication K1 Resistance K1 Manufacturing processes K1 Sensitivity analysis K1 Hardware security K1 Simulation K1 Supply chains K1 hardware supply chain security K1 emerging switching devices K1 machine learning accelerators K1 SOT-MRAM K1 semiconductor fabrication SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISQED60706.2024.10528782 DO https://doi.org/10.1109/ISQED60706.2024.10528782 SF ELIB - SuUB Bremen
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