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1 Ergebnisse
1
The Impact of Scaling on the Effects of Mixed-Mode Electric..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Nergui, D.
;
Hosseinzadeh, M.
;
Mensah, Y. A.
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529309
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>The Impact of Scaling on the Effects of Mixed-Mode Electrical Stress and Ionizing Radiation for 130-nm and 90-nm SiGe HBTs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529309&Exemplar=1&LAN=DE A1 Nergui, D. A1 Hosseinzadeh, M. A1 Mensah, Y. A. A1 Lee, H. P. A1 Sam, D. G. A1 Li, K. A1 Zhang, E. X. A1 Fleetwood, D. M. A1 Cressler, John D. YR 2024 SN 1938-1891 K1 Degradation K1 Ionizing radiation K1 Hot carriers K1 Market research K1 Heterojunction bipolar transistors K1 Reliability K1 Stress K1 SiGe HBT K1 reliability K1 mixed-mode stress K1 hot carriers K1 ionizing radiation K1 total-ionizing dose SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529309 DO https://doi.org/10.1109/IRPS48228.2024.10529309 SF ELIB - SuUB Bremen
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