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1 Ergebnisse
1
Measurement of Aging Effect on an Analog Computing-In-Memor..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Wang, Wei-Chun
;
Zhang, Shida
;
Sharma, Sudarshan
.. - p. 1-4 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529313
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529313&Exemplar=1&LAN=DE A1 Wang, Wei-Chun A1 Zhang, Shida A1 Sharma, Sudarshan A1 Lee, Minah A1 Mukhopadhyay, Saibal YR 2024 SN 1938-1891 K1 Negative bias temperature instability K1 Temperature measurement K1 Degradation K1 Semiconductor device measurement K1 Thermal variables control K1 Current measurement K1 Aging K1 Hot Carrier Injection (HCI) K1 Compute-In-Memory (CIM) K1 Negative Bias Temperature Instability (NBTI) SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529313 DO https://doi.org/10.1109/IRPS48228.2024.10529313 SF ELIB - SuUB Bremen
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