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1 Ergebnisse
1
Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Base..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Ettisserry, Devanarayanan
;
Visconti, Angelo
;
Bonanomi, Mauro
... - p. 1-8 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529336
RT T1
2024 IEEE International Reliability Physics Symposium (IRPS)
: T1
Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM
UL https://suche.suub.uni-bremen.de/peid=ieee-10529336&Exemplar=1&LAN=DE A1 Ettisserry, Devanarayanan A1 Visconti, Angelo A1 Bonanomi, Mauro A1 Pazzocco, Riccardo A1 Locatelli, Andrea A1 Sebastiani, Alessandro A1 Chavan, Ashonita A1 Hollander, Matthew A1 Servalli, Giorgio A1 Calderoni, Alessandro A1 Ramaswamy, Nirmal YR 2024 SN 1938-1891 K1 Measurement K1 Degradation K1 Technological innovation K1 Three-dimensional displays K1 Nonvolatile memory K1 Memory architecture K1 Reliability K1 fatigue K1 ferroelectric memory K1 imprint K1 reliability K1 TDDB SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529336 DO https://doi.org/10.1109/IRPS48228.2024.10529336 SF ELIB - SuUB Bremen
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