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1 Ergebnisse
1
Total-Ionizing Dose Damage from X-Ray PCB Inspection System:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Pieper, N.J.
;
Chun, M.
;
Xiong, Y.
... - p. 1-7 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529337
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529337&Exemplar=1&LAN=DE A1 Pieper, N.J. A1 Chun, M. A1 Xiong, Y. A1 Dattilo, H.M. A1 Kronenberg, J. A1 Baeg, S. A1 Wen, S.-J. A1 Fung, R. A1 Chan, D. A1 Escobar, C. A1 Bhuva, B.L. YR 2024 SN 1938-1891 K1 Manufacturing processes K1 Imaging K1 X-rays K1 Inspection K1 Reliability engineering K1 Distance measurement K1 Transistors K1 TID K1 Ring Oscillator K1 DRAM SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529337 DO https://doi.org/10.1109/IRPS48228.2024.10529337 SF ELIB - SuUB Bremen
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