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1 Ergebnisse
1
Physics-informed machine learning to analyze oxide defect-i..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Varanasi, Anirudh
;
Degraeve, Robin
;
Roussel, Philippe J.
.. - p. 1-7 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529341
RT T1
2024 IEEE International Reliability Physics Symposium (IRPS)
: T1
Physics-informed machine learning to analyze oxide defect-induced RTN in gate leakage current
UL https://suche.suub.uni-bremen.de/peid=ieee-10529341&Exemplar=1&LAN=DE A1 Varanasi, Anirudh A1 Degraeve, Robin A1 Roussel, Philippe J. A1 Vici, Andrea A1 Merckling, Clement YR 2024 SN 1938-1891 K1 Decision making K1 Noise K1 Metals K1 Machine learning K1 Materials reliability K1 Logic gates K1 Reliability engineering K1 Bayesian algorithm K1 oxide defects K1 physics-informed machine learning K1 random telegraph noise K1 stress-induced leakage current SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529341 DO https://doi.org/10.1109/IRPS48228.2024.10529341 SF ELIB - SuUB Bremen
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