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1 Ergebnisse
1
Robustness to Device Degradation in Silicon FeFET-based Res..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Toprasertpong, Kasidit
;
Nako, Eishin
;
Min, Shin-Yi
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529344
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529344&Exemplar=1&LAN=DE A1 Toprasertpong, Kasidit A1 Nako, Eishin A1 Min, Shin-Yi A1 Cai, Zuocheng A1 Cho, Seong-Kun A1 Suzuki, Rikuo A1 Nakane, Ryosho A1 Takenaka, Mitsuru A1 Takagi, Shinichi YR 2024 SN 1938-1891 K1 Degradation K1 Nonvolatile memory K1 Reservoirs K1 Robustness K1 Silicon K1 Nonlinear dynamical systems K1 Electrostatics K1 Endurance K1 FeFET K1 reservoir computing K1 stable operation K1 time-series data SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529344 DO https://doi.org/10.1109/IRPS48228.2024.10529344 SF ELIB - SuUB Bremen
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