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1 Ergebnisse
1
Investigation of Read Disturb for Hf0.5Zr0.502 Ferroelectri..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Li, Xinze
;
Zeng, Yiqin
;
Wu, Yuxuan
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529346
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Investigation of Read Disturb for Hf0.5Zr0.502 Ferroelectric Field-Effect Transistors Based Neuromorphic Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529346&Exemplar=1&LAN=DE A1 Li, Xinze A1 Zeng, Yiqin A1 Wu, Yuxuan A1 Sun, Ying A1 Qu, Junru A1 Jin, Chengji A1 Gu, Jiani A1 Shern, Rongzong A1 Lin, Gaobo A1 Gao, Dawei A1 Yu, Xiao A1 Chen, Bing A1 Cheng, Ran A1 Han, Genquan YR 2024 SN 1938-1891 K1 Neuromorphics K1 Voltage K1 Switches K1 Logic gates K1 Reliability engineering K1 Iron K1 Transistors K1 FeFET Interface traps K1 current noise K1 read scheme K1 NOR array K1 polarization switching SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529346 DO https://doi.org/10.1109/IRPS48228.2024.10529346 SF ELIB - SuUB Bremen
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