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1 Ergebnisse
1
Non-conducting Hot carrier temperature activation and tempe..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Federspiel, X.
;
Diouf, C.
;
Arunachalam, B.
.. - p. 1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529353
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Non-conducting Hot carrier temperature activation and temperature sense effect</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529353&Exemplar=1&LAN=DE A1 Federspiel, X. A1 Diouf, C. A1 Arunachalam, B. A1 Roy, D. A1 Cacho, F. YR 2024 SN 1938-1891 K1 Temperature sensors K1 Temperature distribution K1 MOSFET K1 Hot carriers K1 Aging K1 Distance measurement K1 Reliability K1 - CMOS reliability K1 OFF -State K1 hot carrier K1 temperature activation SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529353 DO https://doi.org/10.1109/IRPS48228.2024.10529353 SF ELIB - SuUB Bremen
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