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1 Ergebnisse
1
On-Chip Characterization of Random Telegraph Signal Noise i..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Kim, J.
;
Loveless, T. D.
;
Pew, J.
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529354
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529354&Exemplar=1&LAN=DE A1 Kim, J. A1 Loveless, T. D. A1 Pew, J. A1 Young, R. A1 Rcising, D. A1 Nour, M. A1 Manos, P. A1 Chambers, M. A1 Barnaby, H. J. A1 Neucndank, J. YR 2024 SN 1938-1891 K1 Temperature measurement K1 Integrated circuits K1 Semiconductor device measurement K1 Temperature dependence K1 Array signal processing K1 Noise K1 CMOS process K1 Random Telegraph Noise (RTN) K1 Random Telegraph Signal (RTS) CMOS technology K1 Built-in-self-test (BIST) SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529354 DO https://doi.org/10.1109/IRPS48228.2024.10529354 SF ELIB - SuUB Bremen
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