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1 Ergebnisse
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Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm ..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Uemura, Taiki
;
Chung, Byungjin
;
Choi, Jaehee
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529357
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529357&Exemplar=1&LAN=DE A1 Uemura, Taiki A1 Chung, Byungjin A1 Choi, Jaehee A1 Lee, Seungbae A1 Chung, Shinyoung A1 Hwang, Yuchul A1 Pae, Sangwoo YR 2024 SN 1938-1891 K1 Temperature dependence K1 Error analysis K1 Random access memory K1 Silicon-on-insulator K1 Neutrons K1 Market research K1 Reliability SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529357 DO https://doi.org/10.1109/IRPS48228.2024.10529357 SF ELIB - SuUB Bremen
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