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1 Ergebnisse
1
Robustness Assessment Through 77GHz Operating Life Test of ..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Cacho, F.
;
Cathelin, P.
;
Hai, J.
... - p. 4B.3-1-4B.3-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529364
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Robustness Assessment Through 77GHz Operating Life Test of Power Amplifier for Radar Applications in 28nm FD-SOI CMOS</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529364&Exemplar=1&LAN=DE A1 Cacho, F. A1 Cathelin, P. A1 Hai, J. A1 Bouvot, S. A1 Nowakowski, J. A1 Martinez, M. A1 Debroucke, R. A1 Jean, S. A1 Paulin, R. A1 Antonijevic, J. A1 Federspiel, X. A1 Planes, N. A1 Papotto, G. A1 Parisi, A. A1 Finocchiaro, A. A1 Cavarra, A. A1 Castorina, A. A1 Nocera, C. A1 Palmisano, G. YR 2024 SN 1938-1891 K1 Radio frequency K1 Degradation K1 Performance evaluation K1 Semiconductor device modeling K1 Power amplifiers K1 Hot carriers K1 Robustness K1 RF CMOS reliability K1 Power Amplifier K1 Operating Life Test SP 4B.3 OP 1-4B.3-6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529364 DO https://doi.org/10.1109/IRPS48228.2024.10529364 SF ELIB - SuUB Bremen
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