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1 Ergebnisse
1
A Novel Method for the Determination of Electromigration-In..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Shuster-Passage, J.
;
Razek, S. Abdel
;
Mattoo, M.
... - p. 10A.4-1-10A.4-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529368
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>A Novel Method for the Determination of Electromigration-Induced Void Nucleation Stresses</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529368&Exemplar=1&LAN=DE A1 Shuster-Passage, J. A1 Razek, S. Abdel A1 Mattoo, M. A1 Hauschildt, M. A1 Choi, S. A1 Gall, M. A1 Kteyan, A. A1 Choy, J.-H. A1 Sukharev, V. A1 Kraatz, M. A1 Lloyd, J. R. YR 2024 SN 1938-1891 K1 Bridges K1 Electromigration K1 Kelvin K1 Statistical distributions K1 Calibration K1 Reliability K1 Stress K1 electromigration K1 Cu interconnect K1 nucleation K1 void growth K1 critical stress K1 Wheatstone Bridge K1 early failure K1 statistics SP 10A.4 OP 1-10A.4-6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529368 DO https://doi.org/10.1109/IRPS48228.2024.10529368 SF ELIB - SuUB Bremen
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