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1 Ergebnisse
1
Accelerating Device-Circuit Self-Heating Simulations with D..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Chen, Sihao
;
Li, Yu
;
Peng, Baokang
... - p. 7C.1-1-7C.1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529370
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Accelerating Device-Circuit Self-Heating Simulations with Dynamic Time Evolution for GAAFET</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529370&Exemplar=1&LAN=DE A1 Chen, Sihao A1 Li, Yu A1 Peng, Baokang A1 Sun, Zixuan A1 Zhang, Lining A1 Wang, Runsheng A1 Huang, Ru YR 2024 SN 1938-1891 K1 Semiconductor device modeling K1 Geometry K1 Predictive models K1 Logic gates K1 SPICE K1 Integrated circuit modeling K1 Particle swarm optimization K1 GAAFET K1 Self-heating effect (SHE) K1 Dynamic time evolution method (DTEM) K1 circuit reliability SP 7C.1 OP 1-7C.1-6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529370 DO https://doi.org/10.1109/IRPS48228.2024.10529370 SF ELIB - SuUB Bremen
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