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1 Ergebnisse
1
Understanding the Physical Mechanism of RowPress at the Dev..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Zhou, Longda
;
Li, Jie
;
Ren, Pengpeng
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529371
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Understanding the Physical Mechanism of RowPress at the Device-Level in Sub-20 nm DRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529371&Exemplar=1&LAN=DE A1 Zhou, Longda A1 Li, Jie A1 Ren, Pengpeng A1 Ye, Sheng A1 Wang, Da A1 Qiao, Zheng A1 Ji, Zhigang YR 2024 SN 1938-1891 K1 Temperature dependence K1 Solid modeling K1 Three-dimensional displays K1 Random access memory K1 Reliability K1 Physics K1 Electrons K1 DRAM K1 failure mechanisms K1 row hammer (RH) effect K1 RowPress (RP) effect K1 temperature and access pattern dependences SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529371 DO https://doi.org/10.1109/IRPS48228.2024.10529371 SF ELIB - SuUB Bremen
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