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1 Ergebnisse
1
$\mathrm{R}_{\text{ON}}$ and $\mathrm{V}_{\text{TH}}$ Extra..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Favero, D.
;
De Santi, C.
;
Stockman, A.
... - p. 1-4 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529377
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>$\mathrm{R}_{\text{ON}}$ and $\mathrm{V}_{\text{TH}}$ Extraction in Hard-Switched E-mode GaN HEMTs: Impact of Passivation and Layout</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529377&Exemplar=1&LAN=DE A1 Favero, D. A1 De Santi, C. A1 Stockman, A. A1 Nardo, A. A1 Vanmeerbeek, P. A1 Tack, M. A1 Meneghesso, G. A1 Zanoni, E. A1 Meneghini, M. YR 2024 SN 1938-1891 K1 Voltage measurement K1 Phase measurement K1 Pulse measurements K1 Soft switching K1 Switches K1 Logic gates K1 HEMTs K1 Dynamic on-resistance K1 Dynamic threshold voltage K1 GaN-on-Si K1 Hard switching K1 Pulsed IV SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529377 DO https://doi.org/10.1109/IRPS48228.2024.10529377 SF ELIB - SuUB Bremen
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