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1 Ergebnisse
1
De-Coupling Thermo-Migration from Electromigration Using a ..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Pedreira, O. Varela
;
Ding, Y.
;
Coenen, D.
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529380
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>De-Coupling Thermo-Migration from Electromigration Using a Dedicated Test Structure</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529380&Exemplar=1&LAN=DE A1 Pedreira, O. Varela A1 Ding, Y. A1 Coenen, D. A1 Roussel, Ph. A1 Saleh, A. A1 Simons, V. A1 Zahedmanesh, H. A1 Ciofi, I. A1 Croes, K. YR 2024 SN 1938-1891 K1 Electromigration K1 Maximum likelihood estimation K1 Fitting K1 Tungsten K1 Predictive models K1 Mathematical models K1 Reliability K1 Cu injectors K1 Thermo-migration SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529380 DO https://doi.org/10.1109/IRPS48228.2024.10529380 SF ELIB - SuUB Bremen
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