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1 Ergebnisse
1
Design Techniques Evaluation to Mitigate RTS Noise Effect i..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
da Cunha, M. Gouveia
;
Place, S.
;
Gauthier, O.
... - p. P67.TX-1-P67.TX-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529382
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Design Techniques Evaluation to Mitigate RTS Noise Effect in Column ADC of 3D Stacked Image Sensors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529382&Exemplar=1&LAN=DE A1 da Cunha, M. Gouveia A1 Place, S. A1 Gauthier, O. A1 Virollet, N. A1 Vignetti, M. A1 Martin-Gonthier, P. A1 Magnan, P. A1 Goiffon, V. YR 2024 SN 1938-1891 K1 Geometry K1 Three-dimensional displays K1 Circuits K1 Noise K1 Logic gates K1 Reliability engineering K1 Transistors K1 Random Telegraph Signal (RTS) noise K1 CMOS image sensor (CIS) K1 correlated double sampling (CDS) K1 Column Analog-to-Digital Converter (ADC) K1 3D stacked Image Sensors K1 Shallow-Trench Isolation (STI) SP P67.TX OP 1-P67.TX-6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529382 DO https://doi.org/10.1109/IRPS48228.2024.10529382 SF ELIB - SuUB Bremen
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