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1 Ergebnisse
1
Defect Mechanisms Responsible for Silent Data Errors:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Shamsa, Manu
;
Lerner, David
- p. 1-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529392
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Defect Mechanisms Responsible for Silent Data Errors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529392&Exemplar=1&LAN=DE A1 Shamsa, Manu A1 Lerner, David YR 2024 SN 1938-1891 K1 Performance evaluation K1 Sensitivity K1 Tail K1 Silicon K1 System-on-chip K1 Manufacturing K1 Reliability K1 Data Center Quality K1 Silent Data Error K1 Microprocessor Errors K1 Transistor Defects K1 System Reliability SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529392 DO https://doi.org/10.1109/IRPS48228.2024.10529392 SF ELIB - SuUB Bremen
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