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1 Ergebnisse
1
Virtual FA Methodology for DRAM: Real-Time Analysis and Ris..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Lee, Jungchul
;
Kwon, EC
;
Yoon, SH
... - p. 1-7 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529404
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Virtual FA Methodology for DRAM: Real-Time Analysis and Risk Assessment Method Using Telemetry</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529404&Exemplar=1&LAN=DE A1 Lee, Jungchul A1 Kwon, EC A1 Yoon, SH A1 Oh, RG A1 Park, SY A1 Youn, SH A1 Choi, KR A1 Kim, TW A1 Kim, MC A1 Park, JH A1 Ko, YW A1 Kim, YD A1 Moon, JS A1 Park, HA A1 Hong, KO A1 Yang, JY A1 Yoon, JY A1 Yoon, JM A1 Lee, JM A1 Kim, JH A1 Yoo, HY A1 Kim, Sj A1 Lee, NH A1 Lee, SH A1 Kwon, KS A1 Jung, IG A1 Lee, YS A1 Kim, JH A1 Pae, Sangwoo YR 2024 SN 1938-1891 K1 Random access memory K1 Production K1 Real-time systems K1 Telemetry K1 Risk management K1 Reliability K1 Servers K1 DRAM failure K1 failure analysis K1 quality K1 system reliability K1 virtual SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529404 DO https://doi.org/10.1109/IRPS48228.2024.10529404 SF ELIB - SuUB Bremen
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