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1 Ergebnisse
1
On The Role of Stress Engineering of Surface Passivation in..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Mir, Mehak A.
;
Thakare, A.
;
Munshi, M. A.
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529406
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>On The Role of Stress Engineering of Surface Passivation in Determining the Device Performance of AlGaN/GaN HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529406&Exemplar=1&LAN=DE A1 Mir, Mehak A. A1 Thakare, A. A1 Munshi, M. A. A1 Avinash, V. A1 Wani, S. A1 Khan, Z. A1 Chaudhuri, R. A1 Karthik, S. A1 Malik, R. A1 Joshi, V. A1 Shrivastava, M. YR 2024 SN 1938-1891 K1 Performance evaluation K1 Surface resistance K1 Modulation K1 Logic gates K1 Reliability engineering K1 Threshold voltage K1 Wide band gap semiconductors K1 Dynamic ON Resistance K1 AlGaN/GaN HEMTs K1 Stress engineering K1 GaN buffer traps K1 Passivation SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529406 DO https://doi.org/10.1109/IRPS48228.2024.10529406 SF ELIB - SuUB Bremen
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