I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
On-Wafer Dynamic Operation of Power GaN-HEMTs: Degradation ..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Boito, M.
;
Fregolent, M.
;
De Santi, C.
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529407
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>On-Wafer Dynamic Operation of Power GaN-HEMTs: Degradation Processes Investigated by a Novel Experimental Approach</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529407&Exemplar=1&LAN=DE A1 Boito, M. A1 Fregolent, M. A1 De Santi, C. A1 Abbisogni, A. A1 Smerzi, S. A1 Rossetto, I. A1 Iucolano, F. A1 Meneghesso, G. A1 Zanoni, E. A1 Meneghini, M. YR 2024 SN 1938-1891 K1 Degradation K1 Semiconductor device reliability K1 Switches K1 HEMTs K1 Transistors K1 MODFETs K1 Stress K1 Dynamic on-resistance K1 GaN HEMT K1 Hard switching SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529407 DO https://doi.org/10.1109/IRPS48228.2024.10529407 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
