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1 Ergebnisse
1
Experimental Segmentation of Vertical Charge Loss Mechanism..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Chiavarone, L.
;
Nicosia, G.
;
Righetti, N.
. - p. 1-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529408
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Experimental Segmentation of Vertical Charge Loss Mechanisms in Charge Trap-Based 3D NAND Arrays</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529408&Exemplar=1&LAN=DE A1 Chiavarone, L. A1 Nicosia, G. A1 Righetti, N. A1 Dong, Y. YR 2024 SN 1938-1891 K1 Solid modeling K1 Three-dimensional displays K1 Data models K1 Arrays K1 Reliability K1 Object recognition K1 Transient analysis K1 3D NAND K1 charge trap K1 data retention K1 detrapping K1 reliability K1 storage charge loss K1 trap-assisted tunneling K1 vertical charge loss SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529408 DO https://doi.org/10.1109/IRPS48228.2024.10529408 SF ELIB - SuUB Bremen
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