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1 Ergebnisse
1
Investigation of the Impact of Ferroelectricity Boosted Gat..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Higashi, Y.
;
Bastos, J. P.
;
Chasin, A.
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529409
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Investigation of the Impact of Ferroelectricity Boosted Gate Stacks for 3D NAND on Short Time Data Retention and Endurance</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529409&Exemplar=1&LAN=DE A1 Higashi, Y. A1 Bastos, J. P. A1 Chasin, A. A1 Breuil, L. A1 Arreghini, A. A1 Ramesh, S. A1 Rachidi, S. A1 Jeong, Y. A1 Van den bosch, G. A1 Rosmeulen, M. YR 2024 SN 1938-1891 K1 Performance evaluation K1 Three-dimensional displays K1 Logic gates K1 Reliability K1 Transient analysis K1 Physics K1 3D NAND K1 Ferroelectricity K1 reliability K1 data retention K1 endurance SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529409 DO https://doi.org/10.1109/IRPS48228.2024.10529409 SF ELIB - SuUB Bremen
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