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1 Ergebnisse
1
Layout Guidelines against Charging Damage from the Well-Sid..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Kuo, Hsi-Yu
;
Chu, Yu-Lin
;
Dai, Hung-Da
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529413
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Layout Guidelines against Charging Damage from the Well-Side Antennas in Separated Power Domains</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529413&Exemplar=1&LAN=DE A1 Kuo, Hsi-Yu A1 Chu, Yu-Lin A1 Dai, Hung-Da A1 Wang, Chun-Chi A1 Lin, Pei-Jung A1 Kuo, Shu-Cheng A1 Guo, Ethan A1 Zhang, Ya-Min A1 Su, Yu-Ti A1 Hsu, Chia-Lin A1 Chen, Kuan-Hung A1 Chen, Tsung-Yuan A1 Li, Te-Liang A1 Huang, Ray A1 Chen, Kuo-Ji A1 Song, Ming-Hsiang A1 Lu, Ryan A1 Xia, Kejun YR 2024 SN 1938-1891 K1 Geometry K1 Circuit topology K1 Layout K1 Metals K1 Silicon K1 Integrated circuit reliability K1 Antennas K1 PID K1 Well Charging K1 Well-side antennas K1 DNW K1 NBL K1 Cross-domain interface SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529413 DO https://doi.org/10.1109/IRPS48228.2024.10529413 SF ELIB - SuUB Bremen
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