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1 Ergebnisse
1
Missing Trigger Circuit Action and Device Engineering for C..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Goyal, Mitesh
;
Chaturvedi, Mukesh
;
Kumar, Raju
.. - p. 1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529418
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529418&Exemplar=1&LAN=DE A1 Goyal, Mitesh A1 Chaturvedi, Mukesh A1 Kumar, Raju A1 Vaidya, Mahesh A1 Shrivastava, Mayank YR 2024 SN 1938-1891 K1 Resistance K1 Thyristors K1 Solid modeling K1 Three-dimensional displays K1 Rectifiers K1 Electrostatic discharges K1 Reliability engineering K1 SCR Trigger Circuit K1 DTCO in ESD K1 Trigger Action K1 ESD device design K1 Design Tradeoffs in ESD SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529418 DO https://doi.org/10.1109/IRPS48228.2024.10529418 SF ELIB - SuUB Bremen
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