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1 Ergebnisse
1
Physical Study of Low-frequency TDDB Lifetime Deterioration..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Yan, Chu
;
Ding, Yaru
;
Qu, Yiming
. - p. 1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529420
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529420&Exemplar=1&LAN=DE A1 Yan, Chu A1 Ding, Yaru A1 Qu, Yiming A1 Zhao, Yi YR 2024 SN 1938-1891 K1 Logic gates K1 FinFETs K1 Dielectrics K1 High-k dielectric materials K1 Velocity measurement K1 Reliability K1 Stress K1 TDDB K1 FinFET K1 dielectric SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529420 DO https://doi.org/10.1109/IRPS48228.2024.10529420 SF ELIB - SuUB Bremen
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