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1 Ergebnisse
1
Data Retention Insights from Joint Analysis on BEOL-Integra..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Laguerre, J.
;
Martin, S.
;
Coignus, J.
... - p. 1-7 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529427
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529427&Exemplar=1&LAN=DE A1 Laguerre, J. A1 Martin, S. A1 Coignus, J. A1 Carabasse, C. A1 Bocquet, M. A1 Andrieu, F. A1 Grenouillet, L. YR 2024 SN 1938-1891 K1 Temperature distribution K1 Limiting K1 Nonvolatile memory K1 Ferroelectric films K1 Random access memory K1 Time measurement K1 Iron K1 Data Retention K1 Etched Fe Cap K1 FeRAM K1 Imprint K1 Voltage Scaling SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529427 DO https://doi.org/10.1109/IRPS48228.2024.10529427 SF ELIB - SuUB Bremen
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