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1
On the Intrinsic and Extrinsic Reliability Challenges of Si..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Moens, P.
;
Geenen, F.
;
Avramenko, M.
.. - p. 1-7 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529435
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>On the Intrinsic and Extrinsic Reliability Challenges of SiC MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529435&Exemplar=1&LAN=DE A1 Moens, P. A1 Geenen, F. A1 Avramenko, M. A1 Gomez-Garcia, G. A1 Matocha, K. YR 2024 SN 1938-1891 K1 MOSFET K1 Radiation effects K1 Temperature K1 Silicon carbide K1 Logic gates K1 Data mining K1 Transistors K1 Reliability K1 intrinsic K1 extrinsic K1 TDDB K1 ARB K1 Cosmic Ray SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529435 DO https://doi.org/10.1109/IRPS48228.2024.10529435 SF ELIB - SuUB Bremen
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