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1 Ergebnisse
1
Degradation and Recovery Kinetics Study of Vertical and Lat..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Musibau, S.
;
Poumpouridis, N.
;
Tsiara, A.
... - p. 1-10 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529439
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529439&Exemplar=1&LAN=DE A1 Musibau, S. A1 Poumpouridis, N. A1 Tsiara, A. A1 Franco, J. A1 Berciano, M. A1 Van Campenhout, J. A1 De wout, I. A1 Crees, K. YR 2024 SN 1938-1891 K1 Degradation K1 PIN photodiodes K1 Voltage K1 Simulated annealing K1 Dark current K1 Tunneling K1 Germanium K1 Photodiode K1 Degradation kinetics K1 Recovery K1 TCAD K1 Reliability K1 Silicon photonics SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529439 DO https://doi.org/10.1109/IRPS48228.2024.10529439 SF ELIB - SuUB Bremen
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