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1 Ergebnisse
1
Reliability Assesement of Ferroelectric nvCAP for Small-Sig..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Phadke, Omkar
;
Mulaosmanovic, Halid
;
Dunkel, Stefan
.. - p. 1-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529440
RT T1
2024 IEEE International Reliability Physics Symposium (IRPS)
: T1
Reliability Assesement of Ferroelectric nvCAP for Small-Signal Capacitive Read-Out
UL https://suche.suub.uni-bremen.de/peid=ieee-10529440&Exemplar=1&LAN=DE A1 Phadke, Omkar A1 Mulaosmanovic, Halid A1 Dunkel, Stefan A1 Beyer, Sven A1 Yu, Shimeng YR 2024 SN 1938-1891 K1 Performance evaluation K1 Nonvolatile memory K1 Area measurement K1 Noise K1 Random access memory K1 Switches K1 Capacitance K1 ferroelectrics K1 non-volatile capacitor K1 endurance K1 retention K1 multi-level cell K1 recovery SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529440 DO https://doi.org/10.1109/IRPS48228.2024.10529440 SF ELIB - SuUB Bremen
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