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1 Ergebnisse
1
Fast, Scalable, and Highly Accurate Thermal Modeling for Us..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Drandova, Gergana
;
Jimenez, Jose
;
Wisch, Jesse
.. - p. 01-04 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529446
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Fast, Scalable, and Highly Accurate Thermal Modeling for Use in GaN/GaAs RF Circuit Modeling Platforms</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529446&Exemplar=1&LAN=DE A1 Drandova, Gergana A1 Jimenez, Jose A1 Wisch, Jesse A1 Khandelwal, Sourabh A1 Ashby, Kirk YR 2024 SN 1938-1891 K1 Radio frequency K1 Three-dimensional displays K1 Computational modeling K1 Thermal resistance K1 Logic gates K1 HEMTs K1 Finite element analysis K1 Compact RF thermal model K1 GaN HEMT SP 01 OP 04 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529446 DO https://doi.org/10.1109/IRPS48228.2024.10529446 SF ELIB - SuUB Bremen
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