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1 Ergebnisse
1
A Valid Experimental Design of the Lifetime Prediction for ..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Kwo, Hyuk Je
;
Yu, Hyung Suk
;
Choi, Bongman
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529448
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>A Valid Experimental Design of the Lifetime Prediction for NAND Cell Oxide</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529448&Exemplar=1&LAN=DE A1 Kwo, Hyuk Je A1 Yu, Hyung Suk A1 Choi, Bongman A1 Yeom, Jinseon A1 Kim, Hyungsuk A1 Park, Tae-Min A1 Jeong, Jaeyong A1 Kim, Eun Kyoung YR 2024 SN 1938-1891 K1 Degradation K1 Three-dimensional displays K1 Voltage K1 Life estimation K1 Bending K1 Reliability K1 Weibull distribution K1 energy band K1 lifetime-estimation K1 NAND Cell K1 oxide K1 wear-out SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529448 DO https://doi.org/10.1109/IRPS48228.2024.10529448 SF ELIB - SuUB Bremen
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