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1 Ergebnisse
1
A New Method of Automatic Extraction of RTN and OMI-Friendl..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Xiao, Yu
;
Zhang, Chenyang
;
Wang, Da
... - p. P75.TX-1-P75.TX-4 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529452
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529452&Exemplar=1&LAN=DE A1 Xiao, Yu A1 Zhang, Chenyang A1 Wang, Da A1 Xue, Yongkang A1 Ren, Pengpeng A1 Ji, Zhigang YR 2024 SN 1938-1891 K1 Adaptation models K1 Noise K1 Hidden Markov models K1 Reliability engineering K1 Circuit synthesis K1 Integrated circuit modeling K1 Integrated circuit reliability K1 Random telegraph noise K1 Hidden Markov model K1 Gaussian identification K1 adaptive model K1 open model interface SP P75.TX OP 1-P75.TX-4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529452 DO https://doi.org/10.1109/IRPS48228.2024.10529452 SF ELIB - SuUB Bremen
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