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1 Ergebnisse
1
Demonstration of Chip Overclock Detection by Employing Tamp..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Diaz-Fortuny, Javier
;
Saraza-Canflanca, Pablo
;
Romano-Molar, Alex
... - p. 4C.1-1-4C.1-7 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529453
RT T1
2024 IEEE International Reliability Physics Symposium (IRPS)
: T1
Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology
UL https://suche.suub.uni-bremen.de/peid=ieee-10529453&Exemplar=1&LAN=DE A1 Diaz-Fortuny, Javier A1 Saraza-Canflanca, Pablo A1 Romano-Molar, Alex A1 Bury, Erik A1 Degraeve, Robin A1 Kaczer, Ben YR 2024 SN 1938-1891 K1 Degradation K1 Integrated circuits K1 Data centers K1 Voltage K1 Odometers K1 Timing K1 Integrated circuit reliability K1 Bias Temperature Instabilities (BTI) K1 Hot Carrier Degradation (HCD) K1 integrated circuit reliability K1 ring-oscillator (RO) K1 tamper detection K1 array chip K1 overclock SP 4C.1 OP 1-4C.1-7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529453 DO https://doi.org/10.1109/IRPS48228.2024.10529453 SF ELIB - SuUB Bremen
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