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Multiple Bit Upsets in Register Circuits at the 5-nm Bulk F..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Xiong, Yoni ; Pieper, Nicholas J. ; Kronenberg, Jenna B.... - p. P46.RE-1-P46.RE-5 , 2024
Link: https://doi.org/10.1109/IRPS48228.2024.10529454