I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Multiple Bit Upsets in Register Circuits at the 5-nm Bulk F..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Xiong, Yoni
;
Pieper, Nicholas J.
;
Kronenberg, Jenna B.
... - p. P46.RE-1-P46.RE-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529454
RT T1
2024 IEEE International Reliability Physics Symposium (IRPS)
: T1
Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node
UL https://suche.suub.uni-bremen.de/peid=ieee-10529454&Exemplar=1&LAN=DE A1 Xiong, Yoni A1 Pieper, Nicholas J. A1 Kronenberg, Jenna B. A1 Ball, Dennis R. A1 Casey, Megan A1 Bhuva, Bharat L. YR 2024 SN 1938-1891 K1 Circuits K1 Alpha particles K1 Ions K1 FinFETs K1 Shift registers K1 Integrated circuit modeling K1 Integrated circuit reliability K1 soft error K1 FinFET K1 multibit upsets SP P46.RE OP 1-P46.RE-5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529454 DO https://doi.org/10.1109/IRPS48228.2024.10529454 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)