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1 Ergebnisse
1
Low Temperature Characterization and Modeling of Hot Carrie..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Qu, Junru
;
Liu, Dong
;
Chen, Bing
... - p. P70.TX-1-P70.TX-4 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529455
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Low Temperature Characterization and Modeling of Hot Carrier Injection in 14 nm Si FinFET</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529455&Exemplar=1&LAN=DE A1 Qu, Junru A1 Liu, Dong A1 Chen, Bing A1 Sun, Ying A1 Li, Xinze A1 Jin, Chengji A1 Chen, Jiajia A1 Qian, Haoji A1 Shen, Rongzong A1 Yu, Xiao A1 Gao, Dawei A1 Cheng, Ran A1 Han, Genquan YR 2024 SN 1938-1891 K1 Degradation K1 Temperature dependence K1 Switches K1 Hot carrier injection K1 FinFETs K1 Silicon K1 Temperature control K1 Low temperature K1 HCI model K1 14 nm FinFET K1 HCI K1 Interface trap K1 Oxide trap SP P70.TX OP 1-P70.TX-4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529455 DO https://doi.org/10.1109/IRPS48228.2024.10529455 SF ELIB - SuUB Bremen
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