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1 Ergebnisse
1
Microscopic Modeling of MgO Barrier Degradation Due to Inte..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Takashima, Rina
;
Koike, Takeo
;
Itai, Shogo
... - p. P10.EM-1-P10.EM-5 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529458
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Microscopic Modeling of MgO Barrier Degradation Due to Interface Oxygen Frenkel Defects in Scaled MTJ Toward High-Density STT-MRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529458&Exemplar=1&LAN=DE A1 Takashima, Rina A1 Koike, Takeo A1 Itai, Shogo A1 Sugiyama, Hideyuki A1 Lee, Young Min A1 Toko, Masaru A1 Ono, Soichiro A1 Watanabe, Daisuke A1 Oikawa, Soichi A1 Koi, Katsuhiko A1 Kanaya, Hiroyuki A1 Nakayama, Masahiko A1 Nakamura, Kohji YR 2024 SN 1938-1891 K1 Degradation K1 Resistance K1 Torque K1 Microscopy K1 Voltage K1 Reliability theory K1 Tunneling magnetoresistance K1 oxygen defects K1 STT-MRAM K1 time-dependent degradation SP P10.EM OP 1-P10.EM-5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529458 DO https://doi.org/10.1109/IRPS48228.2024.10529458 SF ELIB - SuUB Bremen
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