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1 Ergebnisse
1
Charge Trapping in Irradiated 3D Devices and ICs (Invited):
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Zhang, En Xia
;
Toguchi, Shintaro
;
Guo, Zi Xiang
... - p. 10C.3-1-10C.3-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529460
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Charge Trapping in Irradiated 3D Devices and ICs (Invited)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529460&Exemplar=1&LAN=DE A1 Zhang, En Xia A1 Toguchi, Shintaro A1 Guo, Zi Xiang A1 Alles, Michael L. A1 Schrimpf, Ronald D. A1 Fleetwood, Daniel M. YR 2024 SN 1938-1891 K1 Couplings K1 Ring oscillators K1 Electron traps K1 Three-dimensional displays K1 Silicon-on-insulator K1 Dielectrics K1 Reliability K1 charge trapping K1 total ionizing dose irradiation K1 silicon on insulator K1 3D electronics K1 IGZO K1 MOS SP 10C.3 OP 1-10C.3-6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529460 DO https://doi.org/10.1109/IRPS48228.2024.10529460 SF ELIB - SuUB Bremen
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