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1 Ergebnisse
1
The First Investigation of Switching Lifetime on Parallel-C..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Huang, Yifei
;
Jiang, Qimeng
;
Huang, Sen
... - p. 2C.2-1-2C.2-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529463
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>The First Investigation of Switching Lifetime on Parallel-Connected GaN Power Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529463&Exemplar=1&LAN=DE A1 Huang, Yifei A1 Jiang, Qimeng A1 Huang, Sen A1 Dai, Xinyue A1 Wang, Xinhua A1 Liu, Xinyu YR 2024 SN 1938-1891 K1 Degradation K1 Power system measurements K1 Density measurement K1 Switches K1 Reliability K1 Transient analysis K1 Physics K1 GaN K1 Parallel K1 ON-resistance degradation K1 reliability K1 lifetime SP 2C.2 OP 1-2C.2-6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529463 DO https://doi.org/10.1109/IRPS48228.2024.10529463 SF ELIB - SuUB Bremen
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