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Scaling Trends and Bias Dependence of SRAM SER from 16-nm t..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Narasimham, B. ; Montoya, A. R. ; Paone, C.... - p. 10C.2-1-10C.2-4 , 2024
Link: https://doi.org/10.1109/IRPS48228.2024.10529467