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1 Ergebnisse
1
Hot Carrier Dynamics and Electrical Breakdown Analysis in 2..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Verma, Rupali
;
Patbhaje, Utpreksh
;
Shah, Asif Altaf
... - p. P74.TX-1-P74.TX-4 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529469
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Hot Carrier Dynamics and Electrical Breakdown Analysis in 2D Transition Metal Dichalcogenide FETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529469&Exemplar=1&LAN=DE A1 Verma, Rupali A1 Patbhaje, Utpreksh A1 Shah, Asif Altaf A1 Kumar, Jeevesh A1 Chaudhuri, Rajarshi Roy A1 Dar, Aadil Bashir A1 Shrivastava, Mayank YR 2024 SN 1938-1891 K1 Electric breakdown K1 Two-dimensional displays K1 Field effect transistors K1 Schottky barriers K1 Modulation K1 Hot carriers K1 Electroluminescence K1 2D Materials K1 Avalanche Breakdown K1 Transition Metal Dichalcogenides SP P74.TX OP 1-P74.TX-4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529469 DO https://doi.org/10.1109/IRPS48228.2024.10529469 SF ELIB - SuUB Bremen
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