I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Modeling of Negative Bias Temperature Instability (NBTI) fo..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Liu, Leitao
;
Fang, Jingtian
;
Pal, Ashish
... - p. 7B.5-1-7B.5-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529471
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529471&Exemplar=1&LAN=DE A1 Liu, Leitao A1 Fang, Jingtian A1 Pal, Ashish A1 Asenov, Plamen A1 Bajaj, Mohit A1 Deng, Bei A1 Lin, Xi-Wei A1 Mahapatra, Souvik A1 Kengeri, Subi A1 Bazizi, El Mehdi YR 2024 SN 1938-1891 K1 Negative bias temperature instability K1 Solid modeling K1 Temperature distribution K1 Three-dimensional displays K1 Thermal variables control K1 Gallium arsenide K1 Hydrogen K1 Negative Bias Temperature Instability K1 Gate-all-around K1 Nanosheet K1 RD K1 RDD K1 SiGe SP 7B.5 OP 1-7B.5-6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529471 DO https://doi.org/10.1109/IRPS48228.2024.10529471 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
