I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
PBTI in Scaled Oxide Submicron Enhancement Mode High-K Gall..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Joy, Soumitra
;
Joshi, Kaustubh
;
Zubair, Ahmad
... - p. 6B.1-1-6B.1-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529481
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>PBTI in Scaled Oxide Submicron Enhancement Mode High-K Gallium Nitride Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529481&Exemplar=1&LAN=DE A1 Joy, Soumitra A1 Joshi, Kaustubh A1 Zubair, Ahmad A1 Bader, Samuel A1 Peck, Jason A1 Beumer, Michael A1 Koirala, Pratik A1 Radosavljevic, Marko A1 Vora, Heli A1 Meric, Inanc A1 Then, Han Wui YR 2024 SN 1938-1891 K1 Degradation K1 Semiconductor device modeling K1 Logic gates K1 HEMTs K1 Silicon K1 Threshold voltage K1 JFETs K1 - E-Mode GaN K1 GaN MOSHEMT K1 PBTI K1 Reliability K1 Scaled Transistor K1 Thin Gate Dielectric SP 6B.1 OP 1-6B.1-6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529481 DO https://doi.org/10.1109/IRPS48228.2024.10529481 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
