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1 Ergebnisse
1
Low-PBTS defect-engineered high-mobility metal-oxide BEOL t..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Beltrando, Bastien
;
Coppolelli, Bruno
;
Kim, Jung-Bae
... - p. 4A.2-1-4A.2-6 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529484
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Low-PBTS defect-engineered high-mobility metal-oxide BEOL transistors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529484&Exemplar=1&LAN=DE A1 Beltrando, Bastien A1 Coppolelli, Bruno A1 Kim, Jung-Bae A1 Bae, Yang Ho A1 Weeks, Stephen A1 Enman, Lisa A1 Saheli, Ghazal A1 Cornigli, Davide A1 Brinkley, Stuart A1 Saly, Mark A1 Larcher, Luca A1 Yim, Dong Kil A1 Pesic, Milan YR 2024 SN 1938-1891 K1 Reliability engineering K1 Stability analysis K1 Transistors K1 Integrated circuit reliability K1 Thermal stability K1 Physics K1 Ginestra® K1 High-mobility K1 IGZO K1 Modelling K1 PBTS K1 Transistor SP 4A.2 OP 1-4A.2-6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529484 DO https://doi.org/10.1109/IRPS48228.2024.10529484 SF ELIB - SuUB Bremen
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