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1 Ergebnisse
1
Comparing the Reliability of Solid-State Drives Based on TL..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Frickey, Robert
;
Doller, Joseph
;
Norton, Robert
... - p. 3A.1-1-3A.1-7 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529487
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Comparing the Reliability of Solid-State Drives Based on TLC and QLC NAND Flash Memories (Invited)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529487&Exemplar=1&LAN=DE A1 Frickey, Robert A1 Doller, Joseph A1 Norton, Robert A1 Sancho, Roman A1 Sayyad, Rakhshanda A1 Ustinov, Dmitry A1 Wang, Raymond A1 Xu, Harvey YR 2024 SN 1938-1891 K1 Solid state drives K1 Reviews K1 Random access memory K1 Quality of service K1 Software K1 Reliability K1 Flash memories K1 SSD reliability K1 3D NAND Flash K1 QLC adoption K1 Reliability Demonstration Test K1 QLC Field Data SP 3A.1 OP 1-3A.1-7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529487 DO https://doi.org/10.1109/IRPS48228.2024.10529487 SF ELIB - SuUB Bremen
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