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1 Ergebnisse
1
A Full Transient ElectroThermal - Elastoplastic Mechanical ..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Shqair, Mustafa
;
Sarraute, Emmanuel
;
Richardeau, Frederic
- p. 7B.2-1-7B.2-8 , 2024
Link:
https://doi.org/10.1109/IRPS48228.2024.10529493
RT T1 <cTitle>2024 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>A Full Transient ElectroThermal - Elastoplastic Mechanical and Metallurgical 2D FEM of SiC MOSFET for Gate-Region Stress Investigation under Short-Pulse Short-Circuit (Invited)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10529493&Exemplar=1&LAN=DE A1 Shqair, Mustafa A1 Sarraute, Emmanuel A1 Richardeau, Frederic YR 2024 SN 1938-1891 K1 Semiconductor device modeling K1 MOSFET K1 Temperature distribution K1 Silicon carbide K1 Logic gates K1 Predictive models K1 Finite element analysis K1 SiC MOSFET K1 Gate-damage K1 Al's melting K1 ILD fracture K1 Multiphysics FEM SP 7B.2 OP 1-7B.2-8 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48228.2024.10529493 DO https://doi.org/10.1109/IRPS48228.2024.10529493 SF ELIB - SuUB Bremen
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