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1 Ergebnisse
1
Substrate Current Improvement and Investigation in Low Volt..:
, In:
2024 Conference of Science and Technology for Integrated Circuits (CSTIC)
,
Xu, Zhaozhao
;
Tian, Tian
;
Fang, Mingxu
... - p. 1-4 , 2024
Link:
https://doi.org/10.1109/CSTIC61820.2024.10531865
RT T1 <cTitle>2024 Conference of Science and Technology for Integrated Circuits (CSTIC)</cTitle>: T1 <Title>Substrate Current Improvement and Investigation in Low Voltage Power Ldmos with A Novel Design</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10531865&Exemplar=1&LAN=DE A1 Xu, Zhaozhao A1 Tian, Tian A1 Fang, Mingxu A1 Song, Wan A1 Zhang, Yintong A1 Fang, Ziquan A1 Liu, Donghua A1 Chen, Hualun A1 Qian, Wensheng YR 2024 K1 Kirk field collapse effect K1 Integrated circuits K1 Low voltage K1 Voltage K1 Logic gates K1 Hot carrier injection K1 Transistors K1 Stepped filed plate (SFP) K1 stepped oxide (SO) K1 lateral double-diffused metal-oxide-semiconductor (LDMOS) K1 substrate current, hot carrier injection (HCI) SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC61820.2024.10531865 DO https://doi.org/10.1109/CSTIC61820.2024.10531865 SF ELIB - SuUB Bremen
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